{"id":3166,"date":"2024-03-20T17:00:13","date_gmt":"2024-03-20T17:00:13","guid":{"rendered":"https:\/\/lassonde.yorku.ca\/eecs\/?post_type=mec-events&#038;p=3166"},"modified":"2025-05-26T14:13:00","modified_gmt":"2025-05-26T14:13:00","slug":"jie","status":"publish","type":"mec-events","link":"https:\/\/lassonde.yorku.ca\/eecs\/events\/jie\/","title":{"rendered":"Jie Zhang"},"content":{"rendered":"<p>AI + SE Seminar Series (December 13, 2024. 10 am -11 pm EST).<\/p>\n<h3>Mutation for Assessing and Improving AI Systems<\/h3>\n<p>Traditional Mutation Testing in software testing applies a fixed set of mutation operators to generate mutants for the purpose of test assessment. However, the power of mutants extends significantly beyond test evaluation. In this talk, I will share my experiences in exploring the power the mutants in testing and improving AI systems, such as using mutations for improving machine translators, validating ML classifiers, as well as benchmarking and mitigating LLM bias and hallucinations.<\/p>\n<h3>Bio<\/h3>\n<p>Dr. Jie M. Zhang is a lecturer (assistant professor) at King\u2019s College London. Before joining King\u2019s she was a Research Fellow at University College London and a research consultant for Meta. She got her PHD degree at Peking University in 2018 with an outstanding graduation award. Her main research interests are AI and software trustworthiness and LLMs4Code. She is a steering committee member of IEEE ICST and ACM AIware. She is a Program co-chair of AIware 2024, Internetware 2024, ASE 2023 NIER track, SANER 2023 Journal-First Track, PRDC 2023 Fast Abstract Track, SBST 2021, Mutation 2021&amp;2020, and ASE 2019 Student Research Competition. Over the last three years, she has been invited to give over 20 talks at conferences, universities, and IT companies, including five keynote talks. She has been selected as the top-fifteen 2023 Global Chinese Female Young Scholars in interdisciplinary AI. Her research on machine learning testing has won the 2022 Transactions on Software Engineering Best Paper award.<\/p>\n<p>For more details, please visit: <a href=\"https:\/\/www.kcl.ac.uk\/people\/jie-zhang\">https:\/\/www.kcl.ac.uk\/people\/jie-zhang<\/a><\/p>\n<p>EECS Upcoming Events: <a href=\"https:\/\/lassonde.yorku.ca\/eecs\/eecs-upcoming-events\/\">https:\/\/lassonde.yorku.ca\/eecs\/eecs-upcoming-events\/<\/a><\/p>\n<p>Zoom Recording: <a href=\"https:\/\/yorku.zoom.us\/rec\/share\/fSydcQ3od9lHgaOtM7IuAZa9RO3dRaV_fugTrPa7W2BiBQjQ-enC9MBllIPP3pfq.YD-ojoQpcNRHRZeq\">here<\/a><\/p>\n","protected":false},"excerpt":{"rendered":"<p>AI + SE Seminar Series (December 13, 2024. 10 am -11 pm EST). Mutation for Assessing and Improving AI Systems Traditional Mutation Testing in software testing applies a fixed set of mutation operators to generate mutants for the purpose of test assessment. However, the power of mutants extends significantly beyond test evaluation. In this talk,&#8230;<\/p>\n","protected":false},"author":264,"featured_media":3168,"comment_status":"closed","ping_status":"closed","template":"","tags":[],"mec_category":[],"class_list":["post-3166","mec-events","type-mec-events","status-publish","has-post-thumbnail","hentry"],"yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v26.9 - https:\/\/yoast.com\/product\/yoast-seo-wordpress\/ -->\n<title>Jie Zhang | Electrical Engineering and Computer Science<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/lassonde.yorku.ca\/eecs\/events\/jie\/\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"Jie Zhang | Electrical Engineering and Computer Science\" \/>\n<meta property=\"og:description\" content=\"AI + SE Seminar Series (December 13, 2024. 10 am -11 pm EST). Mutation for Assessing and Improving AI Systems Traditional Mutation Testing in software testing applies a fixed set of mutation operators to generate mutants for the purpose of test assessment. However, the power of mutants extends significantly beyond test evaluation. In this talk,...\" \/>\n<meta property=\"og:url\" content=\"https:\/\/lassonde.yorku.ca\/eecs\/events\/jie\/\" \/>\n<meta property=\"og:site_name\" content=\"Electrical Engineering and Computer Science\" \/>\n<meta property=\"article:modified_time\" content=\"2025-05-26T14:13:00+00:00\" \/>\n<meta property=\"og:image\" content=\"https:\/\/lassonde.yorku.ca\/eecs\/wp-content\/uploads\/sites\/6\/2024\/03\/thumbnail_Screenshot-2024-02-29-at-20.39.41.png\" \/>\n\t<meta property=\"og:image:width\" content=\"448\" \/>\n\t<meta property=\"og:image:height\" content=\"582\" \/>\n\t<meta property=\"og:image:type\" content=\"image\/png\" \/>\n<meta name=\"twitter:card\" content=\"summary_large_image\" \/>\n<meta name=\"twitter:label1\" content=\"Est. reading time\" \/>\n\t<meta name=\"twitter:data1\" content=\"2 minutes\" \/>\n<script type=\"application\/ld+json\" class=\"yoast-schema-graph\">{\"@context\":\"https:\/\/schema.org\",\"@graph\":[{\"@type\":\"WebPage\",\"@id\":\"https:\/\/lassonde.yorku.ca\/eecs\/events\/jie\/\",\"url\":\"https:\/\/lassonde.yorku.ca\/eecs\/events\/jie\/\",\"name\":\"Jie Zhang | Electrical Engineering and Computer Science\",\"isPartOf\":{\"@id\":\"https:\/\/lassonde.yorku.ca\/eecs\/#website\"},\"primaryImageOfPage\":{\"@id\":\"https:\/\/lassonde.yorku.ca\/eecs\/events\/jie\/#primaryimage\"},\"image\":{\"@id\":\"https:\/\/lassonde.yorku.ca\/eecs\/events\/jie\/#primaryimage\"},\"thumbnailUrl\":\"https:\/\/lassonde.yorku.ca\/eecs\/wp-content\/uploads\/sites\/6\/2024\/03\/thumbnail_Screenshot-2024-02-29-at-20.39.41.png\",\"datePublished\":\"2024-03-20T17:00:13+00:00\",\"dateModified\":\"2025-05-26T14:13:00+00:00\",\"breadcrumb\":{\"@id\":\"https:\/\/lassonde.yorku.ca\/eecs\/events\/jie\/#breadcrumb\"},\"inLanguage\":\"en-US\",\"potentialAction\":[{\"@type\":\"ReadAction\",\"target\":[\"https:\/\/lassonde.yorku.ca\/eecs\/events\/jie\/\"]}]},{\"@type\":\"ImageObject\",\"inLanguage\":\"en-US\",\"@id\":\"https:\/\/lassonde.yorku.ca\/eecs\/events\/jie\/#primaryimage\",\"url\":\"https:\/\/lassonde.yorku.ca\/eecs\/wp-content\/uploads\/sites\/6\/2024\/03\/thumbnail_Screenshot-2024-02-29-at-20.39.41.png\",\"contentUrl\":\"https:\/\/lassonde.yorku.ca\/eecs\/wp-content\/uploads\/sites\/6\/2024\/03\/thumbnail_Screenshot-2024-02-29-at-20.39.41.png\",\"width\":448,\"height\":582,\"caption\":\"Jie Zhang\"},{\"@type\":\"BreadcrumbList\",\"@id\":\"https:\/\/lassonde.yorku.ca\/eecs\/events\/jie\/#breadcrumb\",\"itemListElement\":[{\"@type\":\"ListItem\",\"position\":1,\"name\":\"Home\",\"item\":\"https:\/\/lassonde.yorku.ca\/eecs\/\"},{\"@type\":\"ListItem\",\"position\":2,\"name\":\"Events\",\"item\":\"https:\/\/lassonde.yorku.ca\/eecs\/events\/\"},{\"@type\":\"ListItem\",\"position\":3,\"name\":\"Jie Zhang\"}]},{\"@type\":\"WebSite\",\"@id\":\"https:\/\/lassonde.yorku.ca\/eecs\/#website\",\"url\":\"https:\/\/lassonde.yorku.ca\/eecs\/\",\"name\":\"Electrical Engineering and Computer Science\",\"description\":\"Just another Lassonde - Site Network Sites site\",\"potentialAction\":[{\"@type\":\"SearchAction\",\"target\":{\"@type\":\"EntryPoint\",\"urlTemplate\":\"https:\/\/lassonde.yorku.ca\/eecs\/?s={search_term_string}\"},\"query-input\":{\"@type\":\"PropertyValueSpecification\",\"valueRequired\":true,\"valueName\":\"search_term_string\"}}],\"inLanguage\":\"en-US\"}]}<\/script>\n<!-- \/ Yoast SEO plugin. -->","yoast_head_json":{"title":"Jie Zhang | Electrical Engineering and Computer Science","robots":{"index":"index","follow":"follow","max-snippet":"max-snippet:-1","max-image-preview":"max-image-preview:large","max-video-preview":"max-video-preview:-1"},"canonical":"https:\/\/lassonde.yorku.ca\/eecs\/events\/jie\/","og_locale":"en_US","og_type":"article","og_title":"Jie Zhang | Electrical Engineering and Computer Science","og_description":"AI + SE Seminar Series (December 13, 2024. 10 am -11 pm EST). Mutation for Assessing and Improving AI Systems Traditional Mutation Testing in software testing applies a fixed set of mutation operators to generate mutants for the purpose of test assessment. However, the power of mutants extends significantly beyond test evaluation. In this talk,...","og_url":"https:\/\/lassonde.yorku.ca\/eecs\/events\/jie\/","og_site_name":"Electrical Engineering and Computer Science","article_modified_time":"2025-05-26T14:13:00+00:00","og_image":[{"width":448,"height":582,"url":"https:\/\/lassonde.yorku.ca\/eecs\/wp-content\/uploads\/sites\/6\/2024\/03\/thumbnail_Screenshot-2024-02-29-at-20.39.41.png","type":"image\/png"}],"twitter_card":"summary_large_image","twitter_misc":{"Est. reading time":"2 minutes"},"schema":{"@context":"https:\/\/schema.org","@graph":[{"@type":"WebPage","@id":"https:\/\/lassonde.yorku.ca\/eecs\/events\/jie\/","url":"https:\/\/lassonde.yorku.ca\/eecs\/events\/jie\/","name":"Jie Zhang | Electrical Engineering and Computer Science","isPartOf":{"@id":"https:\/\/lassonde.yorku.ca\/eecs\/#website"},"primaryImageOfPage":{"@id":"https:\/\/lassonde.yorku.ca\/eecs\/events\/jie\/#primaryimage"},"image":{"@id":"https:\/\/lassonde.yorku.ca\/eecs\/events\/jie\/#primaryimage"},"thumbnailUrl":"https:\/\/lassonde.yorku.ca\/eecs\/wp-content\/uploads\/sites\/6\/2024\/03\/thumbnail_Screenshot-2024-02-29-at-20.39.41.png","datePublished":"2024-03-20T17:00:13+00:00","dateModified":"2025-05-26T14:13:00+00:00","breadcrumb":{"@id":"https:\/\/lassonde.yorku.ca\/eecs\/events\/jie\/#breadcrumb"},"inLanguage":"en-US","potentialAction":[{"@type":"ReadAction","target":["https:\/\/lassonde.yorku.ca\/eecs\/events\/jie\/"]}]},{"@type":"ImageObject","inLanguage":"en-US","@id":"https:\/\/lassonde.yorku.ca\/eecs\/events\/jie\/#primaryimage","url":"https:\/\/lassonde.yorku.ca\/eecs\/wp-content\/uploads\/sites\/6\/2024\/03\/thumbnail_Screenshot-2024-02-29-at-20.39.41.png","contentUrl":"https:\/\/lassonde.yorku.ca\/eecs\/wp-content\/uploads\/sites\/6\/2024\/03\/thumbnail_Screenshot-2024-02-29-at-20.39.41.png","width":448,"height":582,"caption":"Jie Zhang"},{"@type":"BreadcrumbList","@id":"https:\/\/lassonde.yorku.ca\/eecs\/events\/jie\/#breadcrumb","itemListElement":[{"@type":"ListItem","position":1,"name":"Home","item":"https:\/\/lassonde.yorku.ca\/eecs\/"},{"@type":"ListItem","position":2,"name":"Events","item":"https:\/\/lassonde.yorku.ca\/eecs\/events\/"},{"@type":"ListItem","position":3,"name":"Jie Zhang"}]},{"@type":"WebSite","@id":"https:\/\/lassonde.yorku.ca\/eecs\/#website","url":"https:\/\/lassonde.yorku.ca\/eecs\/","name":"Electrical Engineering and Computer Science","description":"Just another Lassonde - Site Network Sites site","potentialAction":[{"@type":"SearchAction","target":{"@type":"EntryPoint","urlTemplate":"https:\/\/lassonde.yorku.ca\/eecs\/?s={search_term_string}"},"query-input":{"@type":"PropertyValueSpecification","valueRequired":true,"valueName":"search_term_string"}}],"inLanguage":"en-US"}]}},"_links":{"self":[{"href":"https:\/\/lassonde.yorku.ca\/eecs\/wp-json\/wp\/v2\/mec-events\/3166","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/lassonde.yorku.ca\/eecs\/wp-json\/wp\/v2\/mec-events"}],"about":[{"href":"https:\/\/lassonde.yorku.ca\/eecs\/wp-json\/wp\/v2\/types\/mec-events"}],"author":[{"embeddable":true,"href":"https:\/\/lassonde.yorku.ca\/eecs\/wp-json\/wp\/v2\/users\/264"}],"replies":[{"embeddable":true,"href":"https:\/\/lassonde.yorku.ca\/eecs\/wp-json\/wp\/v2\/comments?post=3166"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/lassonde.yorku.ca\/eecs\/wp-json\/wp\/v2\/media\/3168"}],"wp:attachment":[{"href":"https:\/\/lassonde.yorku.ca\/eecs\/wp-json\/wp\/v2\/media?parent=3166"}],"wp:term":[{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/lassonde.yorku.ca\/eecs\/wp-json\/wp\/v2\/tags?post=3166"},{"taxonomy":"mec_category","embeddable":true,"href":"https:\/\/lassonde.yorku.ca\/eecs\/wp-json\/wp\/v2\/mec_category?post=3166"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}